分光便利帳

SPring-8におけるマイクロビームを用いた蛍光X線分析
X-ray fluorescence analysis using X-ray Microbeam in SPring-8

寺田靖子
Yasuko TERADA

　SPring-8におけるX線マイクロビームの現状を簡単に紹介すると共に， 最近開発した，高エネルギー領域でのマイクロビームについて，37keVにおけるビーム評価とX線分析への応用について述べる．

　A recent advance in X-ray microbeam is reviewed. A Kirkpatrick-Baez mirror was used for the X-ray focusing device in high energy X-ray region. The focused beam was 1.3 mm in horizontal direction, 1.5 mm in vertical direction at 37 keV. X-ray fluorescence analysis of Cd accumulated plant was performed using high energy X-ray microbeam. This method has given useful information as to the distribution of Cd in sub-cellular levels, which can be used for understanding of the accumulation mechanism.

Keywords:　X-ray fluorescence analysis, High-energy X-ray, microbeam, SPring-8, synchrotron radiation